Structure of the hidden interfaces in liquid crystal electro-optical cell studied by X-ray scattering and atomic force microscopy

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Resumo

The structure of interfacial boundaries in a liquid crystal (LC) cell, composed of sequential layers of a thin-film electrode, an alignment polymer coating, and a ferroelectric LC, was investigated using X-ray scattering and atomic force microscopy. Quantitative parameters describing the structure of transition layers were obtained, along with statistical data on interface roughness and dielectric constant distribution across the film. These data are expected to provide a link between the roughness and anchoring properties of LC materials at interfaces and give an assessment of the structural modifications occurring at each stage of the electro-optical cell assembly.

Sobre autores

Y. Volkov

National Research Center "Kurchatov Institute"; Y. A. Osipyan Institute of Solid State Physics, Russian Academy Sciences

Email: volkov.y@crys.ras.ru
Moscow, Russia; Chernogolovka, Russia

B. Roshchin

National Research Center "Kurchatov Institute"

Moscow, Russia

A. Nuzhdin

National Research Center "Kurchatov Institute"

Moscow, Russia

A. Zhukovich-Gordeeva

P. N. Lebedev Physical Institute, Russian Academy Sciences

Moscow, Russia

E. Pozhidaev

P. N. Lebedev Physical Institute, Russian Academy Sciences

Moscow, Russia

R. Gainutdinov

National Research Center "Kurchatov Institute"

Moscow, Russia

V. Asadchikov

National Research Center "Kurchatov Institute"

Moscow, Russia

B. Ostrovskii

National Research Center "Kurchatov Institute"; Y. A. Osipyan Institute of Solid State Physics, Russian Academy Sciences

Moscow, Russia

Bibliografia

  1. L. M. Blinov, Structure and Properties of Liquid Crystals, Springer, Heidelberg (2011).
  2. P. Oswald and P. Pieranski, Nematic and Cholesteric Liquid Crystals: Concepts and Physical Properties Illustrated by Experiments, Taylor and Francis, Boca Raton (2005).
  3. R. B. Meyer, L. Liebert, L. Strzelecki, and P. Keller, J. Physique Lett. 36, 69 (1975).
  4. E. Pozhidaev, V. Chigrinov, A. Murauski, V. Molkin, D. Tao, and H.-S. Kwok, Journal of the Society for Information Display 20, 273 (2012).
  5. Q. Guo, K. Yan, V. Chigrinov, H. Zhao, and M. Tribelsky, Crystals 9, 470 (2019).
  6. A. V. Kuznetsov, A. A. Zhukovich-Gordeeva, N. A. Smirnov and E. P. Pozhidaev, Bull. Lebedev Phys. Inst. 50, 159 (2023).
  7. A. Kazmacheev, E. P. Pozhidaev, V. Rudyak, A. V. Emelyanenko, and A. Khokhlov, Phys. Rev. E 97, 042703 (2018).
  8. U. Pietsch, V. Holy, and T. Baumbach, High Resolution X-Ray Scattering: From Thin Films to Lateral Nanostructures, Springer, N.Y. (2004).
  9. M. Tolan, X-Ray Scattering from Soft-Matter Thin Films, Springer Tracts in Modern Physics, Springer-Verlag, Berlin (1999), v.148.
  10. V. E. Asadchikov, A. G. Babak, A. V. Buzmakov et al. (Collaboration), Instrum. Exper. Techniques 48(3), 364 (2005).
  11. W. Weber and B. Lengeler, Phys. Rev. B 46(12), 7953 (1992).
  12. Yu. O. Volkov, B. S. Roshchin, A. D. Nuzhdin, B. I. Ostrovskii, and V. E. Asadchikov, in Proc. conf. "Prikadnaya Optika", S.-Petersburg, Skifia-Press, 2024, to be published (in Russian).
  13. I. V. Kozhevnikov, Cryst. Rep. 57(4), 490 (2012).
  14. I. V. Kozhevnikov, L. Peverini, and E. Ziegler, Phys. Rev. B 85, 125439 (2012).
  15. G. Palasantzas, Phys. Rev. B 48(19), 14472 (1993).
  16. V. E. Asadchikov, A. Duparré, I. V. Kozhevnikov, Yu. S. Krivonosov, and S. I. Sagitov, Proc. SPIE 3738, 387 (1999).
  17. F. Hanus, A. Jadin, and L. D. Laude, Appl. Surf. Sci. 96–98, 807 (1996).
  18. H. Kim, J. S. Horwitz, G. Kushto, A. Piqué, Z. H. Kafafi, C. M. Gilmore, and D. B. Chrisey, J. Appl. Phys. 88, 6021 (2000).
  19. Q. Li, W. Mao, Y. Zhou, C. Wang, Y. Liu, and C. He, J. Appl. Phys. 118(2), 025304 (2015).
  20. J. A. Hillier, P. Patsalas, D. Karfardis, W. Cranton, A. V. Nabok, C. J. Mellor, D. C. Koutsogeorgis, and N. Kalfagiannis, Opt. Mater. Express 12, 4310 (2022).
  21. F. N. Chukhovskii and B. S. Roshchin, Acta Cryst. A 71, 612 (2015).
  22. Z. Wang, P. Servio, and A. D. Rey, Soft Matter 21, 4517 (2025); doi: 10.1039/D5SM00121H
  23. E. Pozhidaev and V. Chigrinov, Cryst. Rep. 51, 1030 (2006).

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