X-Ray Image Registration by a Detector Based on Microchannel Plates

Yu. M. Yarmoshenko; Ярмошенко Ю. М.; I. E. Kantur; Кантур И. Э.; V. E. Dolgikh; Долгих В. Е.; T. V. Kuznetsova; Кузнецова Т. В.

doi:10.31857/S003281622303028X

X-Ray Image Registration by a Detector Based on Microchannel Plates

作者: Yarmoshenko Y.M.¹, Kantur I.E.¹, Dolgikh V.E.¹, Kuznetsova T.V.¹^,2
隶属关系:
1. Mikheev Institute of Metal Physics, Ural Branch, Russian Academy of Sciences
2. Eltsin Ural Federal University
期: 编号 3 (2023)
页面: 91-97
栏目: ОБЩАЯ ЭКСПЕРИМЕНТАЛЬНАЯ ТЕХНИКА
URL: https://vestnik-pp.samgtu.ru/0032-8162/article/view/670520
DOI: https://doi.org/10.31857/S003281622303028X
EDN: https://elibrary.ru/CXDTEL
ID: 670520

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详细

An X-ray image registration system that consists of a detector that contains two microchannel plates (MCPs), an optical lens, and a digital video camera is presented. Images of the K-spectra of Ca, Ti, Mn, Fe, and Co were obtained using an X-ray fluorescence spectrometer with a curved quartz crystal and horizontal focusing by the Johann method. Measurements were performed using detectors with gain coefficients of 106 and 107 and two video cameras with different characteristics and pixel sizes. A high speed of spectrum measurements with acceptable statistics has been achieved. The spectrum measurement was duplicated on a one-dimensional position detector.

参考

Kellogg E., Henry P., Murray S., van Speybroeck L., Bjorkholm P. // Rev. Sci. Inst. 1976. V. 47. Iss. 3. P. 282. https://doi.org/10.1063/1.1134632
Duval B.P., Bateman J.E., Peacock N.J. // Rev. Sci. Inst. 1986. V. 57. Iss. 8. P. 2156. https://doi.org/10.1063/1.1138715
Thorn D., Beiersdorfer P. // Rev. Sci. Inst. 2004. V. 75. Iss. 10. P. 3937. https://doi.org/10.1063/1.1789251
Takashi Kameshima, Shun Ono, Togo Kudo, Kyosuke Ozaki, Yoichi Kirihara, Kazuo Kobayashi, Yuichi Inubushi, Makina Yabashi, Toshio Horigome, Andrew Holland, Karen Holland, David Burt, Hajime Murao, Takaki Hatsui // Rev. Sci. Inst. 2014. V. 85. Iss. 3. P. 033110. https://doi.org/10.1063/1.4867668
Белов А.А., Егоров В.В., Калинин А.П., Коровин Н.А., Родионов А.И., Родионов И.Д., Степанов С.Н. // Датчики и системы. 2012. № 12. С. 58.
Hamamatsu MCP documentation. https://www.hamamatsu.com/resources/pdf/ etd/MCP_assembly_TMCP0003E.pdf
Johann H.H. // Zeitschrift für Physik. 1931. V. 69. № 3/4. P. 185.
Блохин М.А. Методы рентгеноспектральных исследований. М.: Гос. изд-во физ.-мат. лит-ры, 1959. С. 154.
Dolgikh V.E., Cherkashenko V.M., Kurmaev E.Z., Goganov D.A., Ovchinnikov E.K., Yarmoshenko Yu.M., Toporkova T.P. // ПTЭ. 1985. № 1. C. 186.
Кантур И.Э., Долгих В.Е., Ярмошенко Ю.М., Кузнецова Т.В. Свидетельство о государственной регистрации программы для ЭВМ № 2022660528 // Опубл. 06.06.2022.