High-Etendue High-Resolution Spectrometer−Polychromator Equipped with Novel sCMOS Cameras for Tokamak Plasma Spectroscopy

N. V. Kuz’min; Кузьмин Н. В.; S. N. Tugarinov; Тугаринов С. Н.; V. V. Serov; Серов В. В.; S. V. Serov; Серов С. В.; G. S. Pavlova; Павлова Г. С.; N. N. Naumenko; Науменко Н. Н.

doi:10.31857/S0032816223060046

High-Etendue High-Resolution Spectrometer−Polychromator Equipped with Novel sCMOS Cameras for Tokamak Plasma Spectroscopy

Authors: Kuz’min N.V.¹, Tugarinov S.N.¹, Serov V.V.¹, Serov S.V.¹, Pavlova G.S.¹, Naumenko N.N.²
Affiliations:
1. Institution “Project Center ITER,” ROSATOM State Atomic Energy Corporation
2. ZAO Solar
Issue: No 6 (2023)
Pages: 85-97
Section: ОБЩАЯ ЭКСПЕРИМЕНТАЛЬНАЯ ТЕХНИКА
URL: https://vestnik-pp.samgtu.ru/0032-8162/article/view/670328
DOI: https://doi.org/10.31857/S0032816223060046
EDN: https://elibrary.ru/WXEOIE
ID: 670328

Cite item

Full Text

Open Access
Restricted Access

Access granted
Restricted Access

Subscription Access

Abstract
About the authors
References
Supplementary files
Statistics

Abstract

An improved prototype of the large-aperture, high-resolution spectrometer−polychromator (the so-called high-etendue spectrometer, HES) has been designed for spectroscopy diagnostics of plasma, in particular, for the Charge-eXchange Recombination Spectroscopy (CXRS) diagnostics at the ITER facility. Ion temperature profiles, poloidal and toroidal plasma rotation velocities, and low-Z impurity densities can be measured using the CXRS technique. The HES is equipped with novel, high-efficiency compact sCMOS cameras with low noise level, wide dynamic range, high quantum efficiency, and almost 100% working cycle. The HES is based on three transmission holographic gratings, which allow its simultaneous operation in three spectral bands: 468 ± 5, 529 ± 5, and 656 ± 6 nm. The main performance characteristics of the cameras, transmission gratings, and the spectrometer as a unit have been measured. It has been established that the characteristics of the developed HES satisfy the requirements for the spectroscopic equipment intended for measurements of the ITER CXRS diagnostic system.

References

Серов С.В., Тугаринов С.Н., Серов В.В., Крупин В.А., Земцов И.А., Красильников А.В., Кузьмин Н.В., Павлова Г.С., Науменко Н.Н. // Физика плазмы. 2022. Т. 48. № 8. С. 700. https://doi.org/10.31857/S0367292121110196
Serov S.V., Tugarinov S.N., Serov V.V., Krupin V.A., Zemtsov I.A., Krasilnikov A.V., Kuz’min N.V., Pavlova G.S., Naumenko N.N. // Plasma Phys. Rep. 2022. V. 48. P. 844. https://doi.org/10.1134/S1063780X22600542
Jiang D., Li Y.Y., Wu X.Q., Zhang T., Lyu B., Gao X., Xu G.S. // Fusion Sci. Technol. 2020. V. 76. P. 723. https://doi.org/10.1080/15361055.2020.1777670
Lee H.H., Lee J.K., Ko W.H. // Fusion Sci. Technol. 2020. V. 76. P. 787. https://doi.org/10.1080/15361055.2020.1790712
Ford O.P., Vanó L., Alonso J.A., Baldzuhn J., Beurs-kens M.N.A., Biedermann C., Bozhenkov S.A., Fuchert G., Geiger B., Hartmann D., Jaspers R.J.E., Kappatou A., Langenberg A., Lazerson S.A., McDermott R.M., McNeely P., Neelis T.W.C., Pablant N.A., Pasch E., Rust N., Schroeder R., Scott E.R., Smith H.M., Wegner Th., Kunkel F., Wolf R.C. // Rev. Sci. Instrum. V. 91. P. 023507. 2020. https://doi.org/10.1063/1.5132936
Диагностика плазмы / Под ред. М.И. Пергамента. М.: Энергоатомиздат, 1990. Вып. 7. С. 56.
Fonck R.J., Darrow D.S., Jaehnig K.P. // Phys. Rev. A. 1984. V. 29. P. 6. https://doi.org/10.1103/PhysRevA.29.3288
Serov S.V., De Bock M., von Hellermann M.G., Tugarinov S.N. // Rev. Sci. Instrum. V. 92. P. 053517. 2021. https://doi.org/10.1063/5.0042029
Тугаринов С.Н., Белокопытов А.А., Кулаков Д.М., Лукин А.В., Науменко Н.Н., Саттаров Ф.А., Серов В.В., Усольцева М.А., Хабанов Ф.О., Шигапова Н.М., Ярцев В.П. // ПТЭ. 2016. № 1. С. 102. https://doi.org/10.7868/S0032816216010158
Tugarinov S.N., Belokopytov A.A., Kulakov D.M., Lukin A.V., Naumenko N.N., Sattarov F.A., Serov V.V., Usoltseva M.A., Khabanov F.O., Shigapova N.M., and Yartsev V.P. // Instr. Exp. Tech. 2016. V. 59. № 1. P. 104. https://doi.org/10.1134/S0020441216010152
Лукин А.В. // Оптический журнал. 2007. Т. 74. С. 80.
https://www.ximea.com
https://www.zemax.com
Зайдель А.Н., Островская Г.В., Островский Ю.И. Техника и практика спектроскопии. М.: Физматлит, 1972. С. 163.
Стриганов А.Р., Одинцова Г.А. Таблицы спектральных линий атомов и ионов. М.: Энергоиздат, 1982.